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DC poleHodnotaJazyk
dc.contributor.authorHuynh, Nhu
dc.contributor.authorCherian, Hebin
dc.contributor.authorAhn, Ethan C.
dc.contributor.editorPinker, Jiří
dc.date.accessioned2021-10-27T10:54:52Z
dc.date.available2021-10-27T10:54:52Z
dc.date.issued2021
dc.identifier.citation2021 International Conference on Applied Electronics: Pilsen, 7th – 8th September 2021, Czech Republic, p. 55-58.en
dc.identifier.isbn978–80–261–0972–3 (Print)
dc.identifier.isbn978–80–261–0973–0 (Online)
dc.identifier.issn1803–7232 (Print)
dc.identifier.issn1805–9597 (Online)
dc.identifier.urihttp://hdl.handle.net/11025/45566
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.rights© University of West Bohemia, 2021en
dc.subjecthardwarové zabezpečenícs
dc.subjectzobrazení útokycs
dc.subjectSEMcs
dc.subjectEDXcs
dc.subjectvznikající NVMcs
dc.subjectSTT-MRAMcs
dc.subjectRRAMcs
dc.titleHardware Security of Emerging Non-Volatile Memory Devices under Imaging Attacksen
dc.typeconferenceObjecten
dc.typekonferenční příspěvekcs
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThe emerging non-volatile memory (NVM) devices are currently changing the landscape of computing hardware. However, their hardware security remains relatively unexplored in the field. This is a critical research problem because given that they are non-volatile, sensitive information may be vulnerable to various physical attacks unless properly encrypted. In this work, we investigated security vulnerability of two emerging non-volatile memory devices (STT-MRAM and RRAM) against the most commonly available, non-destructive physical attack – Scanning Electron Microscope (SEM) imaging. The central premise is that if any difference of memory cells in high resistance and low resistance (bit ‘1’ and ‘0’) states can be detected in SEM, stored data could possibly leak or be stolen by adversaries. It is concluded that unless advanced elemental analysis techniques such as energy dispersive x-ray spectroscopy (EDX) are used, it is very unlikely that the bit information stored in these memory cells leak out by imaging attacks.en
dc.subject.translatedhardware securityen
dc.subject.translatedimaging attacksen
dc.subject.translatedSEMen
dc.subject.translatedEDXen
dc.subject.translatedemerging NVMsen
dc.subject.translatedSTT-MRAMen
dc.subject.translatedRRAMen
dc.type.statusPeer-revieweden
Vyskytuje se v kolekcích:Applied Electronics 2021
Applied Electronics 2021

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