| Title: | Multi-criteria optimization of quality and reliability providing processes of electronic devices |
| Authors: | Bobalo, Jury Nedostup, Leonid Kiselychnyk, Myroslav Melen, Myhaylo Zayarnyuk, Pavlo |
| Citation: | CPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 4th – 6th September 2013 Roztoky u Křivoklátu, Czech Republic, p. V-4. |
| Issue Date: | 2013 |
| Publisher: | University of West Bohemia |
| Document type: | článek konferenční příspěvek article conferenceObject |
| URI: | http://hdl.handle.net/11025/11575 |
| ISBN: | 978-80-261-0247-2 |
| Keywords: | elektronické zařízení;optimalizace výroby;technologické procesy |
| Keywords in different language: | electronic device;manufacturing optimization;technological processes |
| Abstract: | This paper describes the method of electronic devices manufacturing optimization by technical and economic criteria. |
| Rights: | © University of West Bohemia |
| Appears in Collections: | CPEE – AMTEE 2013 CPEE – AMTEE 2013 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Bobalo.pdf | Plný text | 118,79 kB | Adobe PDF | View/Open |
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