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dc.contributor.authorBobalo, Jury
dc.contributor.authorNedostup, Leonid
dc.contributor.authorKiselychnyk, Myroslav
dc.contributor.authorMelen, Myhaylo
dc.contributor.authorZayarnyuk, Pavlo
dc.date.accessioned2014-07-28T10:19:12Z
dc.date.available2014-07-28T10:19:12Z
dc.date.issued2013
dc.identifier.citationCPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 4th – 6th September 2013 Roztoky u Křivoklátu, Czech Republic, p. V-4.en
dc.identifier.isbn978-80-261-0247-2
dc.identifier.urihttp://hdl.handle.net/11025/11575
dc.description.abstractThis paper describes the method of electronic devices manufacturing optimization by technical and economic criteria.en
dc.format1 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.relation.ispartofseriesCPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineeringen
dc.rights© University of West Bohemiaen
dc.subjectelektronické zařízenícs
dc.subjectoptimalizace výrobycs
dc.subjecttechnologické procesycs
dc.titleMulti-criteria optimization of quality and reliability providing processes of electronic devicesen
dc.typečlánekcs
dc.typekonferenční příspěvekcs
dc.typearticleen
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.subject.translatedelectronic deviceen
dc.subject.translatedmanufacturing optimizationen
dc.subject.translatedtechnological processesen
dc.type.statusPeer-revieweden
Appears in Collections:CPEE – AMTEE 2013
CPEE – AMTEE 2013

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