Název:	XPS limit in soft X-ray photoemission spectroscopy of Ag(001)
Autoři:	Nicolai, Laurent Christophe Minár, Jan
Citace zdrojového dokumentu:	NICOLAI, L.C.h., MINÁR, J. XPS limit in soft X-ray photoemission spectroscopy of Ag(001). In AIP Conference Proceedings. MELVILLE, NY: AMER INST PHYSICS, 2018. s. [1-5]. ISBN 978-0-7354-1712-0 , ISSN 0094-243X.
Datum vydání:	2018
Nakladatel:	AIP Publishing
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	2-s2.0-85051855380 http://hdl.handle.net/11025/30738
ISBN:	978-0-7354-1712-0
ISSN:	0094-243X
Klíčová slova v dalším jazyce:	XPS limit, Angle-Resolved PhotoEmission Spectroscopy (ARPES), Coherent Potantial Approximation (CPA), one-step model, phonon contribution, lattice vibration, dipole-selection rule.
Abstrakt v dalším jazyce:	PhotoEmission Spectroscopy (PES) is a surface sensitive technique within the Ultra-Violet regime. A way to make it more bulk sensitive consists in increasing the photon energy for entering the X-ray regime. As a counterpart, this increase breaks the k-conserving dipole selection rule and results in a smearing of the measured electronic band structure caused by phonon-assisted electronic transitions. It is therefore essential to model this physical effect within ab-initio calculations. We herewith sketch the implementation of lattice vibrations within the one-step model of photoemission through the Coherent Potential Approximation (CPA). Moreover, we show a practical example with the case of Ag(001) on which the influence of photon energy and/or temperature is benchmarked and interpreted.
Práva:	© AIP Publishing
Vyskytuje se v kolekcích:	OpenAire Články / Articles (CTM) OBD

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