Title: Design of current-controlled current conveyor stage with systematic current offset reduction
Authors: Šotner, Roman
Prokop, Roman
Jeřábek, Jan
Kledrowetz, Vilém
Fujcik, Lukáš
Dostál, Tomáš
Citation: 2015 International Conference on Applied Electronics: Pilsen, 8th – 9th September 2015, Czech Republic, p.225-228.
Issue Date: 2015
Publisher: Západočeská univerzita v Plzni
Document type: konferenční příspěvek
conferenceObject
URI: http://hdl.handle.net/11025/35127
ISBN: 978-80-261-0385-1 (Print)
978-80-261-0386-8 (Online)
ISSN: 1803-7232 (Print)
1805-9597 (Online)
Keywords: tranzistory;systematika;zrcadla;standardy;integrované obvody CMOS;prsty;zpracování signálu
Keywords in different language: transistors;systematics;mirrors;standards;CMOS integrated circuits;fingers;signal processing
Abstract in different language: This contribution presents modification of current-controlled current conveyor (CCCII) designed in order to reduce the systematic DC current offset of transfer between X and Z terminal and also an example of practical design including practical guideline and recommendations. Simulations in Cadence Spectre simulator with ON Semiconductor/AMIS I2T100 based on 0.7 μm technology CMOS07 were provided for verification of discussed features.
Rights: © University of West Bohemia
Appears in Collections:Applied Electronics 2015
Applied Electronics 2015

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