Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Mora Sierra, Yesid | |
dc.contributor.author | Georgiev, Vjačeslav | |
dc.contributor.author | Mora Sierra, Yesid | |
dc.contributor.editor | Pinker, Jiří | |
dc.date.accessioned | 2019-10-09T06:05:27Z | |
dc.date.available | 2019-10-09T06:05:27Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | 2016 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2016, Czech Republic, p.223-226. | en |
dc.identifier.isbn | 978–80–261–0602–9 (Online) | |
dc.identifier.isbn | 978–80–261–0601–2 (Print) | |
dc.identifier.issn | 1803–7232 (Print) | |
dc.identifier.issn | 1805–9597 (Online) | |
dc.identifier.uri | http://hdl.handle.net/11025/35286 | |
dc.format | 4 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Západočeská univerzita v Plzni | cs |
dc.rights | © Západočeská univerzita v Plzni | cs |
dc.subject | stripy | cs |
dc.subject | fyzika | cs |
dc.subject | polovodičové měřící zařízení | cs |
dc.subject | extrakce příznaků | cs |
dc.subject | polovodičové detektory | cs |
dc.subject | kalibrace | cs |
dc.title | Readout interface for strip detectors with spectrometry applications | en |
dc.type | konferenční příspěvek | cs |
dc.type | conferenceObject | en |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.description.abstract-translated | In the present paper a preliminary design and implementation of a readout interface for strip detectors, using Applied Specific Integrated Circuits (ASICs) is discussed. Key issues are the parameters and features of the main constituent parts of the system: strip detectors, ASICs and driving electronics, as well as the preliminary test-results. The readout interface is intended to be used as a means to investigate the scope of strip detectors employed as spectroscopes in the area of experimental physics and their dynamic properties. | en |
dc.subject.translated | strips | en |
dc.subject.translated | physics | en |
dc.subject.translated | semiconductor device measurement | en |
dc.subject.translated | feature extraction | en |
dc.subject.translated | semiconductor detectors | en |
dc.subject.translated | calibration | en |
dc.type.status | Peer-reviewed | en |
Appears in Collections: | Články / Articles (KAE) Applied Electronics 2016 Applied Electronics 2016 |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Mora Sierra.pdf | Plný text | 1,29 MB | Adobe PDF | View/Open |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/35286
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