Název:	New Design Methodology – Using VHDL-AMS Models to Consider Aging Effects in Automotive Mechatronic Circuits for Safety Relevant Functions
Autoři:	Scharfenberg, Georg Elis, Luděk Hofmann, Gerhard
Citace zdrojového dokumentu:	2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 141-146.
Datum vydání:	2019
Nakladatel:	Západočeská univerzita v Plzni
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	http://hdl.handle.net/11025/35531
ISBN:	978–80–261–0812–2 (Online) 978–80–261–0813–9 (Print)
ISSN:	1803–7232 (Print) 1805-9597 (Online)
Klíčová slova:	funkční bezpečnost;metoda mechatronického návrhu;stárnutí rezistoru
Klíčová slova v dalším jazyce:	functional safety;mechatronic design method;resistor aging
Abstrakt v dalším jazyce:	In this paper a design method for mechatronic functions in an early design phase under consideration of the requirements of functional safety is proposed [14]. The goal of the method is to discover threats for the safety goals and to prove or optimize the diagnostic mechanisms. At the current design process a lifetime endurance test is performed in a late project phase. In order to avoid unexpected late design changes the method should be applied in an early design phase. The method is an additional way to avoid design failures for E/E functions with special focus on aging in the field of functional safety applications. The method is developed out of three standards VDI 2221 methodology for development and construction of technical systems and products [1]), VDI 2206 design methodology for mechatronic systems [2] and the ISO 26262 road vehicles - Functional Safety [3] by using the V-Model. Furthermore, a core element of the design method is simulating aging effects by applying VHDL – AMS. To demonstrate the design methodology a sensor out of the EGAS function is chosen as a safety relevant automotive system. The limitation is the availability of aging data for electrical components.
Práva:	© Západočeská univerzita v Plzni
Vyskytuje se v kolekcích:	Články / Articles (KAE) Applied Electronics 2019 Applied Electronics 2019

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