| Title: | Multi-Criterial Assessment of the Uniformity of the Electrical Potential of Micro-Films |
| Authors: | Teodorescu, Horia-Nicolai Cojocaru, Victor Katashev, Alexei |
| Citation: | 2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 173-176. |
| Issue Date: | 2019 |
| Publisher: | Západočeská univerzita v Plzni |
| Document type: | konferenční příspěvek conferenceObject |
| URI: | http://hdl.handle.net/11025/35538 |
| ISBN: | 978–80–261–0812–2 (Online) 978–80–261–0813–9 (Print) |
| ISSN: | 1803–7232 (Print) 1805-9597 (Online) |
| Keywords: | posuzování uniformity;povrchové vlastnosti;korelační analýza;Allanova variance;Hadamardova variance |
| Keywords in different language: | uniformity assessment;surface properties;correlational analysis;Allan variance;Hadamard variance |
| Abstract in different language: | We propose a method of characterization and assessment of the uniformity of the surface properties of samples based on a set of derived parameters. Local (sliding window) variance, Allan and Hadamard variances and centers of potential for measurement lines are used to assess the uniformity. The method is exemplified for the potential of piezoelectric thin (nano) films, but it is applicable to a large range of properties. |
| Rights: | © Západočeská univerzita v Plzni |
| Appears in Collections: | Applied Electronics 2019 Applied Electronics 2019 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Teodorescu2.pdf | Plný text | 132,67 kB | Adobe PDF | View/Open |
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