Full metadata record
DC poleHodnotaJazyk
dc.contributor.authorNuruyev, S.
dc.contributor.authorAhmadov, G.
dc.contributor.authorSadigov, A.
dc.contributor.authorAkberov, R.
dc.contributor.authorAhmadov, F.
dc.contributor.authorHolík, Michael
dc.contributor.authorKopatch, Yu.
dc.date.accessioned2020-08-31T10:00:25Z-
dc.date.available2020-08-31T10:00:25Z-
dc.date.issued2020
dc.identifier.citationNURUYEV, S., AHMADOV, G., SADIGOV, A., AKBEROV, R., AHMADOV, F., HOLÍK, M., KOPATCH, Y. Performance of silicon photomultipliers at low temperature. Journal of Instrumentation, 2020, roč. 15, č. 3, s. 0-6. ISSN 1748-0221.en
dc.identifier.issn1748-0221
dc.identifier.uri2-s2.0-85084180824
dc.identifier.urihttp://hdl.handle.net/11025/39571
dc.format7 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherIOP Publishingen
dc.relation.ispartofseriesJournal of Instrumentationen
dc.rightsPlný text je přístupný v rámci univerzity přihlášeným uživatelům.cs
dc.rights© IOP Publishingen
dc.titlePerformance of silicon photomultipliers at low temperatureen
dc.typečlánekcs
dc.typearticleen
dc.rights.accessrestrictedAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThe performances of silicon photomultipliers with different structures are investigated at low temperature.The first sample is a micro pixel avalanche photodiode with deep buried pixel structure from Zecotek Photonics Inc. The second and third ones are multi-pixel photo counters with a surface pixel design from Hamamatsu Photonics. The influence of temperature on the main parameters of the photodiodes such as photon detection efficiency (PDE), gain, and capacitance was studied in the temperature range from 0C to -120C.en
dc.subject.translatedcryogenic detectorsen
dc.subject.translatedphoton detectors for UVen
dc.subject.translatedvisible and IR photonsen
dc.subject.translatedPIN diodesen
dc.subject.translatedAPDsen
dc.subject.translatedSi-PMTsen
dc.subject.translatedG-APDsen
dc.subject.translatedCCDsen
dc.subject.translatedEBCCDsen
dc.subject.translatedEMCCDsen
dc.subject.translatedCMOS imagersen
dc.identifier.doi10.1088/1748-0221/15/03/C03003
dc.type.statusPeer-revieweden
dc.identifier.document-number528039600003
dc.identifier.obd43929946
Vyskytuje se v kolekcích:Články / Articles (KAE)
OBD



Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam: http://hdl.handle.net/11025/39571

Všechny záznamy v DSpace jsou chráněny autorskými právy, všechna práva vyhrazena.

hledání
navigace
  1. DSpace at University of West Bohemia
  2. Publikační činnost / Publications
  3. OBD