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DC poleHodnotaJazyk
dc.contributor.authorMacků, Robert
dc.contributor.authorKoktavý, Pavel
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2012-11-06T13:34:31Z
dc.date.available2012-11-06T13:34:31Z
dc.date.issued2011
dc.identifier.citationElectroscope. 2011, č. 2, EEICT 2011.cs
dc.identifier.issn1802-4564
dc.identifier.urihttp://147.228.94.30/images/PDF/Rocnik2011/Cislo2_2011/r5c2c9.pdf
dc.identifier.urihttp://hdl.handle.net/11025/600
dc.format6 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.subjectsolární článkycs
dc.subjectfotonová emisecs
dc.subjectfluktuace elektrického prouducs
dc.subjectlokální poruchycs
dc.subjectelektrooptické metodycs
dc.titleImpact of local defects on photon emission, electric current fluctuation and reliability of silicon solar cells studied by electro-optical methodsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThis paper, for the first time, investigates localized defects of silicon solar cells. These imperfections represent real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this issue, this paper does systematic research about optical investigation of local defect spots and correlation with rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting information using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.en
dc.subject.translatedsolar cellsen
dc.subject.translatedfoton emissionen
dc.subject.translatedelectri current fluctuationen
dc.subject.translatedlocal defectsen
dc.subject.translatedelectro-optical methodsen
dc.type.statusPeer-revieweden
Vyskytuje se v kolekcích:Číslo 2 - EEICT 2011 (2011)
Číslo 2 - EEICT 2011 (2011)

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  1. DSpace at University of West Bohemia
  2. Publikace ZČU / UWB Publications
  3. Časopisy ZČU / UWB Journals
  4. Electroscope
  5. Ročník 2011
  6. Číslo 2 - EEICT 2011 (2011)