Název:	Carrier bulk-lifetime measurement during solar cell production
Autoři:	Solčanský, Marek Vaněk, Jiří
Citace zdrojového dokumentu:	Electroscope. 2011, č. 4, EDS 2011.
Datum vydání:	2011
Nakladatel:	Západočeská univerzita v Plzni, Fakulta elektrotechnická
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	http://147.228.94.30/images/PDF/Rocnik2011/Cislo4_2011/r5c4c7.pdf http://hdl.handle.net/11025/626
ISSN:	1802-4564
Klíčová slova:	chemická pasivace;quinhydrone;životnost nosičů náboje
Klíčová slova v dalším jazyce:	chemical passivation;quinhydrone;carrier bulk lifetime
Abstrakt v dalším jazyce:	The main material parameter of silicon is the minority carrier bulk lifetime and influences the effectiveness of photovoltaic cells. It may change in the technological process especially during high temperature operations. Monitoring of the carrier bulk-lifetime is necessary for modifying the whole technological process of production. This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution remains from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development.
Práva:	Copyright © 2007-2010 Electroscope. All Rights Reserved.
Vyskytuje se v kolekcích:	Číslo 4 - EDS 2011 (2011) Číslo 4 - EDS 2011 (2011)

Všechny záznamy v DSpace jsou chráněny autorskými právy, všechna práva vyhrazena.