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Electroscope
Ročník 2018
Číslo 1 (2018)
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Title
Author(s)
2018
Raman spectroscopy used to assess the temperature and mechanical stress in thin films of microelectronic structures
Kadlečíková, M.
;
Vančo, Ĺ
;
Breza, J.
;
Priesol, J.
;
Šatka, A.
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Author
1
Kadlečíková, M.
1
Vančo, Ĺ
1
Šatka, A.
Subject
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material testing
1
microelectronic structures
1
mikroelektronické struktury
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Raman spectroscopy
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Type
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článek
Date issued
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2018