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dc.contributor.authorSudakov, Anatolii I.
dc.contributor.authorChabanov, Evgenii A.
dc.contributor.authorShulakov, Nikolai V.
dc.date.accessioned2014-07-14T08:11:08Z
dc.date.available2014-07-14T08:11:08Z
dc.date.issued2013
dc.identifier.citationISTET 2013: International Symposiumon Theoretical Electrical Engineering: 24th – 26th June 2013: Pilsen, Czech Republic, p. III-25-III-26.en
dc.identifier.isbn978-80-261-0246-5
dc.identifier.urihttp://hdl.handle.net/11025/11493
dc.description.abstractThe article is devoted to the development of probabilistic and statistical methods (PSM) of researching long transient processes in synchronous machines (SM), occurring under the influence of various random factors. In particular, a new authentic method is explained that is oriented at minimizing the mean square error of approximation of the discrete statistical model of the transient component to the experimental data on a relatively long section of the discrete transition process. The model allows representing the found error in the form of a discrete surface in three dimensions.en
dc.format2 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.relation.ispartofseriesISTET: International Symposium on Theoretical Electrical Engineeringen
dc.rights© University of West Bohemiaen
dc.subjectsynchronní strojecs
dc.subjectpravděpodobnostně-statistické metodycs
dc.subjectsymetrické zkratové zkouškycs
dc.subjectelectrical engineeringcs
dc.titleNovel approaches to analysis of transition processes identification error by probability-statistical methods during sudden symmetric short-circuit tests of synchronous machinesen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.subject.translatedsynchronous machinesen
dc.subject.translatedprobability-statistical methodsen
dc.subject.translatedsymmetric short-circuit testsen
dc.subject.translatedelectrotechnikaen
dc.type.statusPeer-revieweden
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ISTET 2013
ISTET 2013

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