Název:	The influence of nanotechnology and nanometrology on workpiece metrology and interchangeable manufacturing
Autoři:	Bauer Osanna, P. Herbert Durakbasa, M. Numan Crisan, Liviu Bauer, Jorge M.
Citace zdrojového dokumentu:	Strojírenská technologie Plzeň 2009: sborník abstraktů: III. ročník mezinárodní konference konané ve dnech 21.- 22.1.2009 v Plzni. Vyd. 1. Plzeň: ZČU v Plzni, 2009, s. [1]. ISBN 978-80-7043-750-6.
Datum vydání:	2009
Nakladatel:	Západočeská univerzita v Plzni. Fakulta strojní. Katedra technologie obrábění
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	http://hdl.handle.net/11025/16443
ISBN:	978-80-7043-750-6
Klíčová slova:	nanometrologie;nanotechnologie;přesná výroba;management kvality;měřicí technika
Klíčová slova v dalším jazyce:	nanometrology;nanotechnology;precision manufacturing;quality management;measurement techniques
Abstrakt v dalším jazyce:	Increases of quality of technical parts and whole products are not to be joined of cource exclusively with the increase of accuracy but correlation is given up to a certain extent, particularly if the technical development during the 20th century is taken into consideration. This trend develops presently continuosly further on because of the development from microtechnology to nanotechnology, which means particularly special metrologies and production methods for the realization of manufacturing accuracies in the nanometric range. The importance of nanometrology and nanotechnology in general for scientific research and especially for production engineering is described in this manuscript and particularly the influence on technical development and highprecision manufacturing but also for circumstances of human life is demonstrated. High accuracy measurment technique and metrology must be given a key role in modern production and industrial enviroment. Essentials contributions to increase the quality of products and the productive power of industrial plants can be reached through the aimed application of nanometrology.Today we still find nanometrology preferably only in scientific high technology development and reasearch laboratories but the author explains that in the near future it will be integrated also in quality control departments of modern production plants of the insustry of the 21st century.
Práva:	© University of West Bohemia
Vyskytuje se v kolekcích:	Strojírenská technologie - Plzeň 2009 sborník příspěvků Strojírenská technologie - Plzeň 2009 sborník příspěvků

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