Title: Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Authors: Lidig, Christian
Minár, Jan
Braun, Jürgen
Ebert, Hubert
Gloskovskii, Andrei
Krieger, Jonas A.
Strocov, Vladimir N.
Kläui, Mathias
Jourdan, Martin
Citation: LIDIG, C. H., MINÁR, J., BRAUN, J., EBERT, H., GLOSKOVSKII, A., KRIEGER, J. A., STROCOV, V. N., KLÄUI, M., JOURDAN, M. Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy. Physical Review B, 2019, roč. 99, č. 17, s. [1-3]. ISSN 2469-9950.
Issue Date: 2019
Publisher: American Physical Society
Document type: článek
URI: 2-s2.0-85066397682
ISSN: 2469-9950
Keywords in different language: magnetic-properties;band-structure
Abstract in different language: Heusler compounds are promising materials for spintronics with adjustable electronic properties including 100% spin polarization at the Fermi energy. We investigate the electronic states of AlOx capped epitaxial thin films of the ferromagnetic half-metal Co2MnSi ex situ by soft x-ray angular resolved photoemission spectroscopy (SX-ARPES). Good agreement between the experimental SX-ARPES results and photoemission calculations including surface effects was obtained. In particular, we observed in line with our calculations a large photoemission intensity at the center of the Brillouin zone, which does not originate from bulk states, but from a surface resonance. This provides strong evidence for the validity of the previously proposed model based on this resonance, which was applied to explain the huge spin polarization of Co2MnSi observed by angular-integrating UV-photoemission spectroscopy.
Rights: © American Physical Society
Appears in Collections:Články / Articles (RAM)

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