Application of short circuit waveguide method for evaluation of inhomogenities in dielectric sample

Faktorová, Dagmar

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DC pole	Hodnota	Jazyk
dc.contributor.author	Faktorová, Dagmar
dc.contributor.editor	Pihera, Josef
dc.contributor.editor	Steiner, František
dc.date.accessioned	2012-10-08T11:02:05Z
dc.date.available	2012-10-08T11:02:05Z
dc.date.issued	2008
dc.identifier.citation	Electroscope. 2008, Konference EDS 2008.	cs
dc.identifier.citation	EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.	cs
dc.identifier.isbn	978-80-214-3717-3
dc.identifier.issn	1802-4564
dc.identifier.uri	http://hdl.handle.net/11025/516
dc.identifier.uri	http://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/faktorova.pdf
dc.format	4 s.	cs
dc.format.mimetype	application/pdf
dc.language.iso	en	en
dc.publisher	Západočeská univerzita v Plzni, Fakulta elektrotechnická	cs
dc.relation.ispartofseries	Electroscope	cs
dc.rights	Copyright © 2007-2010 Electroscope. All Rights Reserved.	en
dc.subject	dielektrika	cs
dc.subject	kompozit	cs
dc.subject	mikrovlnná diagnostika	cs
dc.subject	testování materiálů	cs
dc.title	Application of short circuit waveguide method for evaluation of inhomogenities in dielectric sample	en
dc.type	konferenční příspěvek	cs
dc.type	conferenceObject	en
dc.rights.access	openAccess	en
dc.type.version	publishedVersion	en
dc.description.abstract-translated	In the paper main consideration is paid to investigation of inhomogenities in dielectric sample from the standpoint of their impedance properties and reflected signal amplitude. Such application include inspecting modern materials such as composites, detecting and characterizing surface and volume flaws, and evaluating the compressive strength of cement structures.The paper deals with measurement of reflex coefficient in dependence on crack depth on dielectric samples on microwave frequencies from the X –band. Evaluations are made by means of quantities used in microwave technique. Obtained quantities are compared with each other and also with analogous to the quantities measured at the same conditions on metal sample.	en
dc.subject.translated	dielectric	en
dc.subject.translated	composite	en
dc.subject.translated	microwave diagnostics	en
dc.subject.translated	material testing	en
dc.type.status	Peer-reviewed	en
Vyskytuje se v kolekcích:	2008 Konference EDS 2008 (2008)

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