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dc.contributor.authorFaktorová, Dagmar
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2012-10-08T11:02:05Z
dc.date.available2012-10-08T11:02:05Z
dc.date.issued2008
dc.identifier.citationElectroscope. 2008, Konference EDS 2008.cs
dc.identifier.citationEDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.cs
dc.identifier.isbn978-80-214-3717-3
dc.identifier.issn1802-4564
dc.identifier.urihttp://hdl.handle.net/11025/516
dc.identifier.urihttp://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/faktorova.pdf
dc.format4 s.
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.subjectdielektrikacs
dc.subjectkompozitcs
dc.subjectmikrovlnná diagnostikacs
dc.subjecttestování materiálůcs
dc.titleApplication of short circuit waveguide method for evaluation of inhomogenities in dielectric sampleen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedIn the paper main consideration is paid to investigation of inhomogenities in dielectric sample from the standpoint of their impedance properties and reflected signal amplitude. Such application include inspecting modern materials such as composites, detecting and characterizing surface and volume flaws, and evaluating the compressive strength of cement structures.The paper deals with measurement of reflex coefficient in dependence on crack depth on dielectric samples on microwave frequencies from the X –band. Evaluations are made by means of quantities used in microwave technique. Obtained quantities are compared with each other and also with analogous to the quantities measured at the same conditions on metal sample.en
dc.subject.translateddielectricen
dc.subject.translatedcompositeen
dc.subject.translatedmicrowave diagnosticsen
dc.subject.translatedmaterial testingen
dc.type.statusPeer-revieweden
Appears in Collections:2008
Konference EDS 2008 (2008)

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