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dc.contributor.authorFeitosa, Raul Queiroz
dc.contributor.authorMota, Guilherme
dc.contributor.authorPaciornik, Sidnei
dc.contributor.editorSkala, Václav
dc.date.accessioned2014-05-29T06:52:34Z
dc.date.available2014-05-29T06:52:34Z
dc.date.issued2001
dc.identifier.citationWSCG '2001: Conference proceedings: The 9-th International Conference in Central Europe on Computer Graphics, Visualization and Computer Vision 2001: University of West Bohemia, Plzen, Czech Republic, February 5.-9., 2001, p. 71-78.en
dc.identifier.isbn80-7082-713-0
dc.identifier.issn1213-6972
dc.identifier.urihttp://wscg.zcu.cz/wscg2001/Papers_2001/R357.pdf
dc.identifier.urihttp://hdl.handle.net/11025/11253
dc.description.abstractThe problem of detecting specific patterns in images of materials obtained through High Resolution Transmission Electron Microscopy is addressed. A supervised classification method is proposed using an extension of Principal Component Analysis and a new a procedure for building the training set. Experiments on two different types of images indicate that the proposed method is superior to the conventional cross-correlation approach. Moreover, using the same number of components, the new dimensionality reduction approach shows a better performance than the standard PCA method.en
dc.format8 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.relation.ispartofseriesWSCG '2001: Conference proceedingsen
dc.rights© University of West Bohemiaen
dc.subjectrozpoznávání vzorůcs
dc.subjectredukce dimezionalitycs
dc.subjectcharakterizace materiálůcs
dc.subjectelektronová mikroskopiecs
dc.titleAn Alternative Approach for Pattern Detection Applied to Materials Characterizationen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.subject.translatedpattern recognitionen
dc.subject.translateddimensionality reductionen
dc.subject.translatedmaterials characterizationen
dc.subject.translatedelectron microscopyen
dc.type.statusPeer-revieweden
Appears in Collections:WSCG '2001: Conference proceedings

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