Title: Robust Bias Corrected Least Squares Fitting of Ellipses
Authors: Halíř, Radim
Citation: WSCG '2000: Conference proceeding: The 8th International Conference in Central Europe on Computers Graphics, Visualization and Interaktive Digital Media '2000 in cooperation with EUROGRAPHICS and IFIP WG 5.10: University of West Bohemia, Plzen, Czech republic, February 7 - 10, 2000, p. 36-43.
Issue Date: 2000
Publisher: University of West Bohemia
Document type: konferenční příspěvek
URI: http://wscg.zcu.cz/wscg2000/Papers_2000/T3.ps.gz
ISBN: 80-7082-612-6
Keywords: elipsa;nejmenší čtverce;rozpoznávání vzorců;M estimátory
Keywords in different language: ellipse;least squares;pattern recognition;M-estimators
Abstract: This paper presents a robust and accurate technique for an estimation of the best-fit ellipse going through the given set of points. The approach is based on a least squares minimization of algebraic distances of the points with a correction of the statistical bias caused during the computation. An accurate ellipse-specific solution is guaranteed even for scattered or noisy data with outliers. Although the final algorithm is iterative, it typically converges in a fraction of time needed for a true orthogonal fitting based on Eucleidan distances of points.
Rights: © University of West Bohemia
Appears in Collections:WSCG '2000: Conference proceeding

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