Full metadata record
DC pole | Hodnota | Jazyk |
---|---|---|
dc.contributor.author | Nagy, Lukáš | |
dc.contributor.author | Chvála, Aleš | |
dc.contributor.author | Stopjaková, Viera | |
dc.contributor.author | Blaho, Michal | |
dc.contributor.author | Kuzmík, Ján | |
dc.contributor.author | Gregušová, Dagmar | |
dc.contributor.author | Šatka, Alexander | |
dc.contributor.editor | Pinker, Jiří | |
dc.date.accessioned | 2019-10-16T06:41:56Z | |
dc.date.available | 2019-10-16T06:41:56Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | 2017 International Conference on Applied Electronics: Pilsen, 5th – 6th September 2017, Czech Republic, p.129-132. | en |
dc.identifier.isbn | 978–80–261–0641–8 (Print) | |
dc.identifier.isbn | 978–80–261–0642–5 (Online) | |
dc.identifier.issn | 1803–7232 (Print) | |
dc.identifier.issn | 1805–9597 (Online) | |
dc.identifier.uri | http://hdl.handle.net/11025/35425 | |
dc.format | 4 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Západočeská univerzita v Plzni | cs |
dc.rights | © Západočeská univerzita v Plzni | cs |
dc.subject | heterostruktura InAlN / GaN | cs |
dc.subject | monolitická integrace | cs |
dc.subject | HEMT tranzistor | cs |
dc.subject | digitální měnič | cs |
dc.title | Performance analysis of monolithically integrated depletion-/enhancement-mode InAlN/GaN heterostructure HEMT transistors | en |
dc.type | konferenční příspěvek | cs |
dc.type | conferenceObject | en |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.description.abstract-translated | The paper addresses a top-down design flow of depletion-load digital inverter formed by monolithically integrated depletion-mode and enhancement-mode high electron mobility transistors (HEMTs) on common InAlN/GaN heterostructure grown on sapphire substrate. We describe the inverter design at transistor level using HSPICE models developed earlier. The inverter layout representation, which also defines the lithographic masks required for the fabrication process, is presented as well. The proposed mask set was designed taking into account the design-for-manufacturing approach. Furthermore, we evaluated measured properties and performance of the fabricated transistors and circuits and recalibrate the transistor models according to the latest measurements. | en |
dc.subject.translated | digital inverter | en |
dc.subject.translated | InAlN/GaN Heterostructure | en |
dc.subject.translated | monolithic integration | en |
dc.subject.translated | HEMT transistor | en |
dc.type.status | Peer-reviewed | en |
Vyskytuje se v kolekcích: | Applied Electronics 2017 Applied Electronics 2017 |
Soubory připojené k záznamu:
Soubor | Popis | Velikost | Formát | |
---|---|---|---|---|
Nagy.pdf | Plný text | 562,89 kB | Adobe PDF | Zobrazit/otevřít |
Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam:
http://hdl.handle.net/11025/35425
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