Full metadata record
| DC pole | Hodnota | Jazyk |
|---|---|---|
| dc.contributor.author | Teodorescu, Horia-Nicolai | |
| dc.contributor.author | Cojocaru, Victor | |
| dc.contributor.author | Katashev, Alexei | |
| dc.contributor.editor | Pinker, Jiří | |
| dc.date.accessioned | 2019-10-21T06:00:21Z | |
| dc.date.available | 2019-10-21T06:00:21Z | |
| dc.date.issued | 2019 | |
| dc.identifier.citation | 2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 173-176. | en |
| dc.identifier.isbn | 978–80–261–0812–2 (Online) | |
| dc.identifier.isbn | 978–80–261–0813–9 (Print) | |
| dc.identifier.issn | 1803–7232 (Print) | |
| dc.identifier.issn | 1805-9597 (Online) | |
| dc.identifier.uri | http://hdl.handle.net/11025/35538 | |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni | cs |
| dc.rights | © Západočeská univerzita v Plzni | cs |
| dc.subject | posuzování uniformity | cs |
| dc.subject | povrchové vlastnosti | cs |
| dc.subject | korelační analýza | cs |
| dc.subject | Allanova variance | cs |
| dc.subject | Hadamardova variance | cs |
| dc.title | Multi-Criterial Assessment of the Uniformity of the Electrical Potential of Micro-Films | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.rights.access | openAccess | en |
| dc.type.version | publishedVersion | en |
| dc.description.abstract-translated | We propose a method of characterization and assessment of the uniformity of the surface properties of samples based on a set of derived parameters. Local (sliding window) variance, Allan and Hadamard variances and centers of potential for measurement lines are used to assess the uniformity. The method is exemplified for the potential of piezoelectric thin (nano) films, but it is applicable to a large range of properties. | en |
| dc.subject.translated | uniformity assessment | en |
| dc.subject.translated | surface properties | en |
| dc.subject.translated | correlational analysis | en |
| dc.subject.translated | Allan variance | en |
| dc.subject.translated | Hadamard variance | en |
| dc.type.status | Peer-reviewed | en |
| Vyskytuje se v kolekcích: | Applied Electronics 2019 Applied Electronics 2019 | |
Soubory připojené k záznamu:
| Soubor | Popis | Velikost | Formát | |
|---|---|---|---|---|
| Teodorescu2.pdf | Plný text | 132,67 kB | Adobe PDF | Zobrazit/otevřít |
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