Název:	Scanning electron microscopy as a useful tool for the analysis of non-conductive materials
Autoři:	Tichá, Iveta Kučerová, Ludmila
Citace zdrojového dokumentu:	KUČEROVÁ, Ludmila ed.; JIRKOVÁ, Hana ed.; JENÍČEK, Štepán ed. Proceedings PING 2020: modern trends in material engineering: 15.-17.09.2020, Pilsen. 1. vyd. Plzeň: University of West Bohemia, 2020, s. 40-41. ISBN 978-80-261-0958-7.
Datum vydání:	2020
Nakladatel:	University of West Bohemia
Typ dokumentu:	konferenční příspěvek conferenceObject
URI:	http://hdl.handle.net/11025/46389
ISBN:	978-80-261-0958-7
Klíčová slova:	rastrovací elektronová mikroskopie;energeticky disperzní rentgenová spektroskopie;nevodivé materiály;fraktografie;uhlíková pórovitost
Klíčová slova v dalším jazyce:	scanning electron microscopy;energy-dispersive X-ray spectroscopy;non-conductive materials;fractography;carbon porosity
Abstrakt v dalším jazyce:	Scanning electron microscopy (SEM) in the analysis of non-conductive samples became one of the most important methods for the investigation of material properties. In this work, we used SEM microstructure analysis for the investigation of the origin of cracks in granite composites and also, we tested the porosity inside the regenerated carbon biowaste, potentially used as a clean source of carbon for the future applications in materials production. Additionally, the porosity of small particles used for the moulding processes of plastics was also tested. The importance of the microstructure investigation was supported by Energy-Dispersive X-ray Spectroscopy (EDS) often used for the chemical composition evaluation of these non-conductive materials.
Práva:	© University of West Bohemia
Vyskytuje se v kolekcích:	Proceedings PING 2020: modern trends in material engineering Proceedings PING 2020: modern trends in material engineering

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