Title: Scintillation breakdowns in tantalum capacitors
Authors: Teverovsky, Alexander
Citation: Electroscope. 2008, Konference EDS 2008.
EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.
Issue Date: 24-Oct-2008
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: článek
konferenční příspěvek
article
conferenceObject
URI: http://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/teverovsky.pdf
http://hdl.handle.net/11025/522
ISBN: 978-80-214-3717-3
ISSN: 1802-4564
Keywords: scintilace;tantalové kapacitory
Keywords in different language: scintillation;tantalum capacitors
Abstract in different language: Scintillations in tantalum capacitors are momentarily local breakdowns terminated by a self-healing, or conversion of the manganese oxide used as a cathode to a high-resistive mode. Similar breakdown events are often considered as nuisances, rather than failures. The author argues that a time-dependent sustained scintillation breakdown can be considered as a major reason of failures during steady-state operation of the capacitors. Analysis of distributions of scintillation breakdown voltages and assessment of the safety margins are critical to assure high quality and reliability of tantalum capacitors.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:2008
Konference EDS 2008 (2008)

Files in This Item:
File Description SizeFormat 
teverovsky.pdf214,46 kBAdobe PDFView/Open


Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/522

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.