| Title: | Scintillation breakdowns in tantalum capacitors |
| Authors: | Teverovsky, Alexander |
| Citation: | Electroscope. 2008, Konference EDS 2008. EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008. |
| Issue Date: | 2008 |
| Publisher: | Západočeská univerzita v Plzni, Fakulta elektrotechnická |
| Document type: | konferenční příspěvek conferenceObject |
| URI: | http://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/teverovsky.pdf http://hdl.handle.net/11025/522 |
| ISBN: | 978-80-214-3717-3 |
| ISSN: | 1802-4564 |
| Keywords: | scintilace;tantalové kapacitory |
| Keywords in different language: | scintillation;tantalum capacitors |
| Abstract in different language: | Scintillations in tantalum capacitors are momentarily local breakdowns terminated by a self-healing, or conversion of the manganese oxide used as a cathode to a high-resistive mode. Similar breakdown events are often considered as nuisances, rather than failures. The author argues that a time-dependent sustained scintillation breakdown can be considered as a major reason of failures during steady-state operation of the capacitors. Analysis of distributions of scintillation breakdown voltages and assessment of the safety margins are critical to assure high quality and reliability of tantalum capacitors. |
| Rights: | Copyright © 2007-2010 Electroscope. All Rights Reserved. |
| Appears in Collections: | 2008 Konference EDS 2008 (2008) |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| teverovsky.pdf | 214,46 kB | Adobe PDF | View/Open |
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