Title: Impact of local defects on photon emission, electric current fluctuation and reliability of silicon solar cells studied by electro-optical methods
Authors: Macků, Robert
Koktavý, Pavel
Citation: Electroscope. 2011, č. 2, EEICT 2011.
Issue Date: 2011
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: konferenční příspěvek
ISSN: 1802-4564
Keywords: solární články;fotonová emise;fluktuace elektrického proudu;lokální poruchy;elektrooptické metody
Keywords in different language: solar cells;foton emission;electri current fluctuation;local defects;electro-optical methods
Abstract in different language: This paper, for the first time, investigates localized defects of silicon solar cells. These imperfections represent real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this issue, this paper does systematic research about optical investigation of local defect spots and correlation with rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting information using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:Číslo 2 - EEICT 2011 (2011)
Číslo 2 - EEICT 2011 (2011)

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Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/600

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