Title: Microscale comparison of solar cell recombination centers
Authors: Škarvada, Pavel
Tománek, Pavel
Koktavý, Pavel
Citation: Electroscope. 2011, č. 4, EDS 2011.
Issue Date: 2011
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: konferenční příspěvek
ISSN: 1802-4564
Keywords: solární články;silikon;defekty;rastrovací sondová mikroskopie
Keywords in different language: sollar cells;silicon;defects;scanning probe microscope
Abstract in different language: The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:Číslo 4 - EDS 2011 (2011)
Číslo 4 - EDS 2011 (2011)

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Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/625

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