Title: | Degradation of Al-1%Si wires bonded onto copper pads |
Authors: | Vehec, Igor Pietriková, Alena Čech, Peter |
Citation: | Electroscope. 2017, č. 2. |
Issue Date: | 2017 |
Publisher: | Západočeská univerzita v Plzni, Fakulta elektrotechnická |
Document type: | článek article |
URI: | http://hdl.handle.net/11025/26596 |
ISSN: | 1802-4564 |
Keywords: | zatížení;Al-1%Si dráty;elektromigrační fenomén |
Keywords in different language: | power load;Al-1%Si wires;electromigration phenomenon |
Abstract in different language: | The current load and its influence on degradation of Al-1%Si wires bonded onto copper pads is presented in this paper. The current load was chosen to occur the electromigration phenomenon during ageing. Our attention was paid to the direction of current from Cu pad to Al wire, and as well as reversed from Al wire to Cu pad. The dependencies of electrical resistance (ΔR/R0) relative change vs time as well as dependencies of mechanical strength vs time for different types of current stresses (direct current IDC and pulse current IPULSE) were obtained and evaluated. The results were evaluated in relation to all above mentioned conditions moreover thermal ageing at 100°C/1000 h was applied and evaluated too. |
Rights: | Copyright © 2007-2010 Electroscope. All Rights Reserved. |
Appears in Collections: | Číslo 2 (2017) - IMAPS flash Conference 2017 Číslo 2 (2017) - IMAPS flash Conference 2017 |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/26596
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