Title: Using VHDL-AMS to simulate aging behavior of electronic components
Authors: Hofmann, Gerhard
Georgiev, Vjačeslav
Citation: 2016 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2016, Czech Republic, p.89-92.
Issue Date: 2016
Publisher: Západočeská univerzita v Plzni
Document type: konferenční příspěvek
URI: http://hdl.handle.net/11025/35195
ISBN: 978–80–261–0601–2 (Print)
978–80–261–0602–9 (Online)
ISSN: 1803–7232 (Print)
1805–9597 (Online)
Keywords: stárnutí;rezistor;modelování integrovaných obvodů;matematický model;výpočetní modelování;knihovny
Keywords in different language: aging;resistors;integrated circuit modeling;mathematical model;SPICE;computational modeling;libraries
Abstract in different language: Reliability of electronics is in the automotive industry very important. The average age of cars in Germany was 9 years at 2015.i Normally the life time is evaluated by the environmental test according ISO 16750. The content of this paper is to contribute that computer simulation of aging is a possible way to evaluate electronic circuits in the define phase. For this reason a VHDL-AMS simulation models is used to model aging behavior of a resistor.
Rights: © Západočeská univerzita v Plzni
Appears in Collections:Články / Articles (KAE)
Applied Electronics 2016
Applied Electronics 2016

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