Title: | Using VHDL-AMS to simulate aging behavior of electronic components |
Authors: | Hofmann, Gerhard Georgiev, Vjačeslav |
Citation: | 2016 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2016, Czech Republic, p.89-92. |
Issue Date: | 2016 |
Publisher: | Západočeská univerzita v Plzni |
Document type: | konferenční příspěvek conferenceObject |
URI: | http://hdl.handle.net/11025/35195 |
ISBN: | 978–80–261–0601–2 (Print) 978–80–261–0602–9 (Online) |
ISSN: | 1803–7232 (Print) 1805–9597 (Online) |
Keywords: | stárnutí;rezistor;modelování integrovaných obvodů;matematický model;výpočetní modelování;knihovny |
Keywords in different language: | aging;resistors;integrated circuit modeling;mathematical model;SPICE;computational modeling;libraries |
Abstract in different language: | Reliability of electronics is in the automotive industry very important. The average age of cars in Germany was 9 years at 2015.i Normally the life time is evaluated by the environmental test according ISO 16750. The content of this paper is to contribute that computer simulation of aging is a possible way to evaluate electronic circuits in the define phase. For this reason a VHDL-AMS simulation models is used to model aging behavior of a resistor. |
Rights: | © Západočeská univerzita v Plzni |
Appears in Collections: | Články / Articles (KAE) Applied Electronics 2016 Applied Electronics 2016 |
Files in This Item:
File | Description | Size | Format | |
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Hofmann.pdf | Plný text | 268,04 kB | Adobe PDF | View/Open |
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http://hdl.handle.net/11025/35195
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